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(16)
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Darowski, Nora
(16)
Pietsch, Ullrich
(14)
Forchel, Alfred
(8)
Lübbert, Daniel
(6)
Wang, K. H.
(6)
Bauer, Günther
(5)
Grenzer, Jörg
(5)
Zerlauth, S.
(5)
Baumbach, Tilo
(4)
Stangl, Jochen
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(15)
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Title
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Author
Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
(1997)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Baumbach, Tilo
;
Zeimer, Ute
Nondestructive analysis of a lateral GaAs nanostructure buried under AlGaAs using conventional high resolution and grazing incidence X-ray diffraction
(1998)
Darowski, Nora
;
Pietsch, Ullrich
;
Zeimer, Ute
;
Smirnitzki, V.
;
Bugge, F.
In-plane strain and strain relaxation in laterally patterned Si/SiGe quantum dots and wire arrays
(1998)
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
;
Zhuang, Y.
;
Zerlauth, S.
;
Bauer, Günther
X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
(1998)
Darowski, Nora
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Shen, W.
;
Kycia, S.
Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
(1998)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Lübbert, Daniel
;
Baumbach, Tilo
Grazing incidence diffraction by epitaxial multilayered gratings
(1998)
Baumbach, Tilo
;
Lübbert, Daniel
;
Pietsch, Uwe
;
Darowski, Nora
;
Leprince, L.
;
Talneau, A.
;
Schneck, J.
Strain analysis and quantum well intermixing of a laterally modulated multiquantum well system produced by focused ion beam implantation
(2001)
Grenzer, Jörg
;
Darowski, Nora
;
Geue, Thomas
;
Pietsch, Ullrich
;
Daniel, A.
;
Rennon, Siegfried
;
Reithmaier, Johann-Peter
;
Forchel, Alfred
Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data
(2000)
Pietsch, Ullrich
;
Darowski, Nora
;
Ulyanenkov, A.
;
Grenzer, Jörg
;
Wang, K. H.
;
Forchel, Alfred
In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction
(2000)
Zhuang, Y.
;
Pietsch, Ullrich
;
Stangl, Jochen
;
Holý, Vaclav
;
Darowski, Nora
;
Grenzer, Jörg
;
Zerlauth, S.
;
Schäffler, F.
;
Bauer, Günther
Grazing-incidence diffraction strain analysis of a laterally-modulated multiquantum well system produced by focused-ion-beam implantation
(2000)
Grenzer, Jörg
;
Darowski, Nora
;
Pietsch, Ullrich
;
Daniel, A.
;
Reithmaier, Johann-Peter
;
Rennon, Siegfried
;
Forchel, Alfred
Lateral arrangement of self-assembled quantum dots in an SiGe/Si superlattice
(1999)
Holý, Václav
;
Stangl, Jochen
;
Zerlauth, S.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
Investigation of the in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]
(1999)
Ulyanenkov, A.
;
Baumbach, Tilo
;
Darowski, Nora
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Wiebach, T.
Evaluation of strain distribution in freestanding and bruied lateral nanostructures
(1999)
Ulyanenkov, A.
;
Darowski, Nora
;
Grenzer, Jörg
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high-resolution x-ray diffrcation and grazing-incidence diffraction
(1999)
Zhuang, Y.
;
Holý, Václav
;
Stangl, Jochen
;
Darhuber, A.
;
Mikulik, P.
;
Zerlauth, S.
;
Schäffler, F.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
HRXRD and GID investigations of a self-organized SiGe quantum dot multilayer
(1999)
Holý, Václav
;
Darhuber, A.
;
Stangl, Jochen
;
Zerlauth, S.
;
Schäffler, F.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
;
Vavra, I.
Charakterisierung mesoskopischer Halbleiter-Lateralstrukturen mittels Photolumineszenzspektroskopie und Röntgenbeugung unter streifendem Einfall
(1999)
Darowski, Nora
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16
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