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Bauer, Günther
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Pietsch, Ullrich
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Stangl, Jochen
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X-ray grazing-incidence study of inhomogeneous strain relaxation in Si/SiGe wires
(2003)
Pietsch, Ullrich
;
Hesse, A.
;
Zhuang, Y.
;
Holý, Vaclav
;
Stangl, Jochen
;
Zerlauth, S.
;
Schaffler, F.
;
Bauer, Günther
Structural and optical properties of Si/Si{1-x}Ge{x} wires
(2000)
Zhuang, Y.
;
Schelling, Christoph
;
Stangl, Jochen
;
Penn, C.
;
Senz, S.
;
Schäffler, Friedrich
;
Roche, T.
;
Daniel, A.
;
Grenzer, Jörg
;
Pietsch, Ullrich
;
Bauer, Günther
In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction
(2000)
Zhuang, Y.
;
Pietsch, Ullrich
;
Stangl, Jochen
;
Holý, Vaclav
;
Darowski, Nora
;
Grenzer, Jörg
;
Zerlauth, S.
;
Schäffler, F.
;
Bauer, Günther
Lateral arrangement of self-assembled quantum dots in an SiGe/Si superlattice
(1999)
Holý, Václav
;
Stangl, Jochen
;
Zerlauth, S.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high-resolution x-ray diffrcation and grazing-incidence diffraction
(1999)
Zhuang, Y.
;
Holý, Václav
;
Stangl, Jochen
;
Darhuber, A.
;
Mikulik, P.
;
Zerlauth, S.
;
Schäffler, F.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
HRXRD and GID investigations of a self-organized SiGe quantum dot multilayer
(1999)
Holý, Václav
;
Darhuber, A.
;
Stangl, Jochen
;
Zerlauth, S.
;
Schäffler, F.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
;
Vavra, I.
1
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6
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