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Author
Gössel, Michael
(10)
Saposhnikov, V. V.
(5)
Saposhnikov, Vl. V.
(4)
Sogomonyan, Egor S.
(3)
Morosov, Andrej
(2)
Otscheretnij, Vitalij
(2)
Seuring, Markus
(2)
Singh, Adit D.
(2)
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1998 (10)
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Institut für Informatik und Computational Science
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Self-Checking circuits with unidiectionally independent outputs
(1998)
Morosov, Andrej
;
Saposhnikov, V. V.
;
Gössel, Michael
A structural approach for space compaction for sequential circuits
(1998)
Seuring, Markus
;
Gössel, Michael
Built-in self-Test with an alternating output
(1998)
Bogue, Ted
;
Gössel, Michael
;
Jürgensen, Helmut
;
Zorian, Yervant
Fault-tolerant self-dual circuits with error detection by parity- and group parity prediction
(1998)
Otscheretnij, Vitalij
;
Gössel, Michael
;
Saposhnikov, Vl. V.
;
Saposhnikov, V. V.
A multi-mode scannable memory element for high test application efficiency and delay testing
(1998)
Sogomonyan, Egor S.
;
Singh, Adit D.
;
Gössel, Michael
A scan based concrrent BIST approach for low cost on-line testing
(1998)
Sogomonyan, Egor S.
;
Singh, Adit D.
;
Gössel, Michael
Self-dual duplication for error detection
(1998)
Saposhnikov, Vl. V.
;
Saposhnikov, V. V.
;
Dimitriev, Alexej
;
Gössel, Michael
A new design method for self-checking unidirectional combinational circuits
(1998)
Saposhnikov, V. V.
;
Morosov, Andrej
;
Saposhnikov, Vl. V.
;
Gössel, Michael
A structural approach for space compaction for concurrent checking and BIST
(1998)
Seuring, Markus
;
Gössel, Michael
;
Sogomonyan, Egor S.
Design of Fault-Tolerant Circuits by self-dual Duplication
(1998)
Saposhnikov, Vl. V.
;
Otscheretnij, Vitalij
;
Saposhnikov, V. V.
;
Gössel, Michael
1
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10
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