P. Gaal, Daniel Schick, Marc Herzog, Andre Bojahr, Roman Shayduk, J. Goldshteyn, Hengameh A. Navirian, Wolfram Leitenberger, Ionela Vrejoiu, D. Khakhulin, M. Wulff, Matias Bargheer
- We employ the ultrafast response of a 15.4 nm thin SrRuO3 layer grown epitaxially on a SrTiO3 substrate to perform time-domain sampling of an x-ray pulse emitted from a synchrotron storage ring. Excitation of the sample with an ultrashort laser pulse triggers coherent expansion and compression waves in the thin layer, which turn the diffraction efficiency on and off at a fixed Bragg angle during 5 ps. This is significantly shorter than the duration of the synchrotron x-ray pulse of 100 ps. Cross-correlation measurements of the ultrafast sample response and the synchrotron x-ray pulse allow to reconstruct the x-ray pulse shape.
