X-ray scattering from thin organic films and multilayers
| Author details: | Ullrich Pietsch, Thomas Andreas Barberka, Thomas Geue, Ralph Stömmer |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 1997 |
| Publication year: | 1997 |
| Release date: | 2017/03/24 |
| Source: | Il nuovo cimento della Societa Italiana di Fisica / D. - 19 (1997), 2/4, S. 393 - 402 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |
