A multi-mode scannable memory element for high test application efficiency and delay testing
Author details: | Egor S. Sogomonyan, Adit D. Singh, Michael GösselGND |
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Publication type: | Article |
Language: | English |
Year of first publication: | 1998 |
Publication year: | 1998 |
Release date: | 2017/03/24 |
Source: | Proceedings / 16th IEEE VLSI Test Symposium. - Los Alamitos : IEEE Computer Society Press, 1998. - S. 324 - 331 |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
Publishing method: | Open Access |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik |