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Highly efficient test response compaction using a hierarchical x-masking technique
- This paper presents a highly effective compactor architecture for processing test responses with a high percentage of x-values. The key component is a hierarchical configurable masking register, which allows the compactor to dynamically adapt to and provide excellent performance over a wide range of x-densities. A major contribution of this paper is a technique that enables the efficient loading of the x-masking data into the masking logic in a parallel fashion using the scan chains. A method for eliminating the requirement for dedicated mask control signals using automated test equipment timing flexibility is also presented. The proposed compactor is especially suited to multisite testing. Experiments with industrial designs show that the proposed compactor enables compaction ratios exceeding 200x.
Author details: | Thomas Rabenalt, Michael Richter, Frank Pöhl, Michael GösselGND |
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DOI: | https://doi.org/10.1109/TCAD.2011.2181847 |
ISSN: | 0278-0070 |
Title of parent work (English): | IEEE transactions on computer-aided design of integrated circuits and systems |
Publisher: | Inst. of Electr. and Electronics Engineers |
Place of publishing: | Piscataway |
Publication type: | Article |
Language: | English |
Year of first publication: | 2012 |
Publication year: | 2012 |
Release date: | 2017/03/26 |
Tag: | Design for testability (DFT); X-masking; X-values; test response compaction |
Volume: | 31 |
Issue: | 6 |
Number of pages: | 8 |
First page: | 950 |
Last Page: | 957 |
Funding institution: | MAYA, German Federal Ministry for Education and Research, [01M3063A] |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
Peer review: | Referiert |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik |