Masking of X-Values by use of a hierarchically configurable register
- In this paper we consider masking of unknowns (X-values) for VLSI circuits. We present a new hierarchical method of X-masking which is a major improvement of the method proposed in [4], called WIDE1. By the method proposed, the number of observable scan cells is optimized and data volume for X-masking can be significantly reduced in comparison to WIDEL This is demonstrated for three industrial designs. In cases where all X-values have to be masked the novel approach is especially efficient.
Author details: | Thomas Rabenalt, Michael Goessel, Andreas Leininger |
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DOI: | https://doi.org/10.1007/s10836-010-5179-2 |
ISSN: | 0923-8174 |
Title of parent work (English): | Journal of electronic testing : theory and applications |
Publisher: | Springer |
Place of publishing: | Dordrecht |
Publication type: | Article |
Language: | English |
Year of first publication: | 2011 |
Publication year: | 2011 |
Release date: | 2017/03/26 |
Tag: | Hierarchically configurable mask register; Masking of X-values |
Volume: | 27 |
Issue: | 1 |
Number of pages: | 11 |
First page: | 31 |
Last Page: | 41 |
Funding institution: | German Federal Ministry for Education and Research (BMBF) [01M3063A] |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
Peer review: | Referiert |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik |