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High-resolution lattice parameter measurement by x-ray grazing incidence diffraction: Application to the interface of silicon on sapphire
| Author details: | T. H. Metzger, Ullrich Pietsch, E. Garstein |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 1999 |
| Publication year: | 1999 |
| Release date: | 2017/03/24 |
| Source: | Physica status solidi / A. - 174 (1999), S. 345 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |
