Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction
Author details: | Ullrich Pietsch |
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ISSN: | 0011-3891 |
Publication type: | Article |
Language: | English |
Year of first publication: | 2000 |
Publication year: | 2000 |
Release date: | 2017/03/24 |
Source: | Current science : fortnightly journal of research. - ISSN 0011-3891. - 78 (2000), 12, S. 1484 - 1495 |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |