X-ray reflectivity from sinusoidal surface relief gratings
Author details: | Thomas Geue, Oliver Henneberg, Ullrich Pietsch |
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ISSN: | 0023-4753 |
Publication type: | Article |
Language: | English |
Year of first publication: | 2002 |
Publication year: | 2002 |
Release date: | 2017/03/24 |
Source: | Crystal research and technology : journal of experimental and industrial crystallography. - ISSN 0023-4753. - 37 (2002), 7, S. 770 - 776 |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |