Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
Author details: | Nora Darowski, K. Paschke, Ullrich Pietsch, K. H. Wang, Alfred Forchel, Daniel Lübbert, Tilo BaumbachORCiD |
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Publication type: | Article |
Language: | English |
Year of first publication: | 1998 |
Publication year: | 1998 |
Release date: | 2017/03/24 |
Source: | Physica / B. - 248 (1998), S. 104 |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |