Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
Author details: | Adit D. Singh, Egor S. Sogomonyan, Michael GösselGND, Markus Seuring |
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Publication type: | Article |
Language: | English |
Year of first publication: | 1999 |
Publication year: | 1999 |
Release date: | 2017/03/24 |
Source: | Proceedings / International test conference 1999. - Piscataway : IEEE Service Center, 1999. - S. 227 - 235 |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
Publishing method: | Open Access |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik |