A comparison fo x-ray methods for structure refinement of Langmuir-Blodgett multilayers
- The possibilities and limits of structure refinement of Langmuir-Blodgett films by means of symmetrical reflection of X- rays are described using the example of a stearic acid multilayer. Three different techniques for the determiantion of the electron density profile from reflectivity data are compared; a Fourier method, a Patterson method, and model calculations. The important role of the a priori information for finding the besft structure model is outlined.
Author details: | Jürgen Reiche, Ullrich Pietsch, Hans-Peter Fink, Helge Lemmetyinen |
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Publication type: | Article |
Language: | English |
Year of first publication: | 1992 |
Publication year: | 1992 |
Release date: | 2017/03/25 |
Source: | Acta Polymerica. - 43 (1992), S. 206 - 209 |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |