Comparative studies of fractal parameters of Si(100) surfaces measured by X-ray scattering and atomic force microscopy
| Author details: | Ralph Stömmer, C. R. Martin, Thomas Geue, H. Göbel, W. Hub, Ullrich Pietsch |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 1998 |
| Publication year: | 1998 |
| Release date: | 2017/03/24 |
| Source: | Advances in X-ray analysis. - 41 (1998) |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |
