Comparative studies of fractal parameters of Si(100) surfaces measured by X-ray scattering and atomic force microscopy
Author details: | Ralph Stömmer, C. R. Martin, Thomas Geue, H. Göbel, W. Hub, Ullrich Pietsch |
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Publication type: | Article |
Language: | English |
Year of first publication: | 1998 |
Publication year: | 1998 |
Release date: | 2017/03/24 |
Source: | Advances in X-ray analysis. - 41 (1998) |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |