Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
| Author details: | Nora Darowski, K. Paschke, Ullrich Pietsch, K. H. Wang, Alfred Forchel, Tilo BaumbachORCiD, Ute Zeimer |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 1997 |
| Publication year: | 1997 |
| Release date: | 2017/03/24 |
| Source: | Journal of physics / D. - 30 (1997), L., S. 55 - 59 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |
