Characterizing LB-layers by IR-ellipsometry
Author details: | A. Röseler, Reinhard Dietel, E. H. Korte |
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Publication type: | Article |
Language: | English |
Year of first publication: | 1995 |
Publication year: | 1995 |
Release date: | 2017/03/25 |
Source: | International Conference on Fourier Transform Spectroscopy <10, 1995, Budapest> |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |