X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
| Author details: | Nora Darowski, Ullrich Pietsch, K. H. Wang, Alfred Forchel, W. Shen, S. Kycia |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 1998 |
| Publication year: | 1998 |
| Release date: | 2017/03/24 |
| Source: | Thin solid films. - 236 (1998), S. 271 - 276 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |
