Sensitivity analysis of ellipsometry applied to uniaxial optical films
| Author details: | C. Flueraru, Sigurd Schrader, V. Zauls, H. Motschmann |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 2000 |
| Publication year: | 2000 |
| Release date: | 2017/03/24 |
| Source: | Thin solid films. - 379 (2000), 1/2, S. 15 - 22 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |
