Handling manufacturing and aging faults with software-based techniques in tiny embedded systems
- Non-volatile memory area occupies a large portion of the area of a chip in an embedded system. Such memories are prone to manufacturing faults, retention faults, and aging faults. The paper presents a single software based technique that allows for handling all of these fault types in tiny embedded systems without the need for hardware support. This is beneficial for low-cost embedded systems with simple memory architectures. A software infrastructure and a flow are presented that demonstrate how the presented technique is used in general for fault handling right after manufacturing and in-the-field. Moreover, a full implementation is presented for a MSP430 microcontroller, along with a discussion of the performance, overhead, and reliability impacts.
| Verfasserangaben: | Felix MühlbauerORCiD, Lukas Schröder, Patryk Skoncej, Mario SchölzelORCiDGND |
|---|---|
| DOI: | https://doi.org/10.1109/LATW.2017.7906756 |
| ISBN: | 978-1-5386-0415-1 |
| Titel des übergeordneten Werks (Englisch): | 18th IEEE Latin American Test Symposium (LATS 2017) |
| Verlag: | IEEE |
| Verlagsort: | New York |
| Publikationstyp: | Sonstiges |
| Sprache: | Englisch |
| Datum der Erstveröffentlichung: | 24.04.2027 |
| Erscheinungsjahr: | 2017 |
| Datum der Freischaltung: | 18.11.2022 |
| Aufsatznummer: | 16837119 |
| Seitenanzahl: | 6 |
| Organisationseinheiten: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
| DDC-Klassifikation: | 0 Informatik, Informationswissenschaft, allgemeine Werke / 00 Informatik, Wissen, Systeme |
| Peer Review: | Referiert |
