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This work introduces an embedded approach for the prediction of Solar Particle Events (SPEs) in space applications by combining the real-time Soft Error Rate (SER) measurement with SRAM-based detector and the offline trained machine learning model. The proposed approach is intended for the self-adaptive fault-tolerant multiprocessing systems employed in space applications. With respect to the state-of-the-art, our solution allows for predicting the SER 1 h in advance and fine-grained hourly tracking of SER variations during SPEs as well as under normal conditions. Therefore, the target system can activate the appropriate mechanisms for radiation hardening before the onset of high radiation levels. Based on the comparison of five different machine learning algorithms trained with the public space flux database, the preliminary results indicate that the best prediction accuracy is achieved with the recurrent neural network (RNN) with long short-term memory (LSTM).
This paper presents a scalable E-band radar platform based on single-channel fully integrated transceivers (TRX) manufactured using 130-nm silicon-germanium (SiGe) BiCMOS technology. The TRX is suitable for flexible radar systems exploiting massive multiple-input-multipleoutput (MIMO) techniques for multidimensional sensing. A fully integrated fractional-N phase-locked loop (PLL) comprising a 39.5-GHz voltage-controlled oscillator is used to generate wideband frequency-modulated continuous-wave (FMCW) chirp for E-band radar front ends. The TRX is equipped with a vector modulator (VM) for high-speed carrier modulation and beam-forming techniques. A single TRX achieves 19.2-dBm maximum output power and 27.5-dB total conversion gain with input-referred 1-dB compression point of -10 dBm. It consumes 220 mA from 3.3-V supply and occupies 3.96 mm(2) silicon area. A two-channel radar platform based on full-custom TRXs and PLL was fabricated to demonstrate high-precision and high-resolution FMCW sensing. The radar enables up to 10-GHz frequency ramp generation in 74-84-GHz range, which results in 1.5-cm spatial resolution. Due to high output power, thus high signal-to-noise ratio (SNR), a ranging precision of 7.5 mu m for a target at 2 m was achieved. The proposed architecture supports scalable multichannel applications for automotive FMCW using a single local oscillator (LO).
The relentless improvement of silicon photonics is making optical interconnects and networks appealing for use in miniaturized systems, where electrical interconnects cannot keep up with the growing levels of core integration due to bandwidth density and power efficiency limitations. At the same time, solutions such as 3D stacking or 2.5D integration open the door to a fully dedicated process optimization for the photonic die. However, an architecture-level integration challenge arises between the electronic network and the optical one in such tightly-integrated parallel systems. It consists of adapting signaling rates, matching the different levels of communication parallelism, handling cross-domain flow control, addressing re-synchronization concerns, and avoiding protocol-dependent deadlock. The associated energy and performance overhead may offset the inherent benefits of the emerging technology itself. This paper explores a hybrid CMOS-ECL bridge architecture between 3D-stacked technology-heterogeneous networks-on-chip (NoCs). The different ways of overcoming the serialization challenge (i.e., through an improvement of the signaling rate and/or through space-/wavelength division multiplexing options) give rise to a configuration space that the paper explores, in search for the most energy-efficient configuration for high-performance.
In this paper two new methods for the design of fault-tolerant pipelined sequential and combinational circuits, called Error Detection and Partial Error Correction (EDPEC) and Full Error Detection and Correction (FEDC), are described. The proposed methods are based on an Error Detection Logic (EDC) in the combinational circuit part combined with fault tolerant memory elements implemented using fault tolerant master-slave flip-flops. If a transient error, due to a transient fault in the combinational circuit part is detected by the EDC, the error signal controls the latching stage of the flip-flops such that the previous correct state of the register stage is retained until the transient error disappears. The system can continue to work in its previous correct state and no additional recovery procedure (with typically reduced clock frequency) is necessary. The target applications are dataflow processing blocks, for which software-based recovery methods cannot be easily applied. The presented architectures address both single events as well as timing faults of arbitrarily long duration. An example of this architecture is developed and described, based on the carry look-ahead adder. The timing conditions are carefully investigated and simulated up to the layout level. The enhancement of the baseline architecture is demonstrated with respect to the achieved fault tolerance for the single event and timing faults. It is observed that the number of uncorrected single events is reduced by the EDPEC architecture by 2.36 times compared with previous solution. The FEDC architecture further reduces the number of uncorrected events to zero and outperforms the Triple Modular Redundancy (TMR) with respect to correction of timing faults. The power overhead of both new architectures is about 26-28% lower than the TMR. (C) 2015 Elsevier Ltd. All rights reserved.
The soft error rate (SER) due to heavy-ion irradiation of a clock tree is investigated in this paper. A method for clock tree SER prediction is developed, which employs a dedicated soft error analysis tool to characterize the single-event transient (SET) sensitivities of clock inverters and other commercial tools to calculate the SER through fault-injection simulations. A test circuit including a flip-flop chain and clock tree in a 65 nm CMOS technology is developed through the automatic ASIC design flow. This circuit is analyzed with the developed method to calculate its clock tree SER. In addition, this circuit is implemented in a 65 nm test chip and irradiated by heavy ions to measure its SER resulting from the SETs in the clock tree. The experimental and calculation results of this case study present good correlation, which verifies the effectiveness of the developed method.
The simultaneous switching activity in digital circuits challenges the design of mixed-signal SoCs. Rather than focusing on time-domain noise voltage minimization, this work optimizes switching noise in the frequency domain. A two-tier solution based on the on-chip clock scheduling is proposed. First, to cope with the switching noise at the fundamental clock frequency, which usually dominates in terms of noise power, a two-phase clocking scheme is employed for system timing. Second, on-chip clock latencies are manipulated to target harmonic peaks in specific frequency bands for the spectral noise optimization. An automated design flow, which allows for noise optimization in user-defined application-specific frequency bands, is developed. The effectiveness of our design solution is validated by measurements of substrate noise and conductive EMI (electromagnetic interference) noise on a test chip, which consists of four wireless sensor node baseband processors each addressing a distinct clock-tree-synthesis strategy. Compared to the reference synchronous design, the proposed clock scheduling solution substantially reduces noise in the target GSM-850 band, i.e., by 11.1 dB on the substrate noise and 12.9 dB on the EMI noise, along with dramatic noise peak drops measured at the 50-MHz clock frequency.
In this paper two new methods for the design of fault-tolerant pipelined sequential and combinational circuits, called Error Detection and Partial Error Correction (EDPEC) and Full Error Detection and Correction (FEDC), are described. The proposed methods are based on an Error Detection Logic (EDC) in the combinational circuit part combined with fault tolerant memory elements implemented using fault tolerant master–slave flip-flops. If a transient error, due to a transient fault in the combinational circuit part is detected by the EDC, the error signal controls the latching stage of the flip-flops such that the previous correct state of the register stage is retained until the transient error disappears. The system can continue to work in its previous correct state and no additional recovery procedure (with typically reduced clock frequency) is necessary. The target applications are dataflow processing blocks, for which software-based recovery methods cannot be easily applied. The presented architectures address both single events as well as timing faults of arbitrarily long duration. An example of this architecture is developed and described, based on the carry look-ahead adder. The timing conditions are carefully investigated and simulated up to the layout level. The enhancement of the baseline architecture is demonstrated with respect to the achieved fault tolerance for the single event and timing faults. It is observed that the number of uncorrected single events is reduced by the EDPEC architecture by 2.36 times compared with previous solution. The FEDC architecture further reduces the number of uncorrected events to zero and outperforms the Triple Modular Redundancy (TMR) with respect to correction of timing faults. The power overhead of both new architectures is about 26–28% lower than the TMR.
Full error detection and correction method applied on pipelined structure using two approaches
(2020)
In this paper, two approaches are evaluated using the Full Error Detection and Correction (FEDC) method for a pipelined structure. The approaches are referred to as Full Duplication with Comparison (FDC) and Concurrent Checking with Parity Prediction (CCPP). Aforementioned approaches are focused on the borderline cases of FEDC method which implement Error Detection Circuit (EDC) in two manners for the purpose of protection of combinational logic to address the soft errors of unspecified duration. The FDC approach implements a full duplication of the combinational circuit, as the most complex and expensive implementation of the FEDC method, and the CCPP approach implements only the parity prediction bit, being the simplest and cheapest technique, for soft error detection. Both approaches are capable of detecting soft errors in the combinational logic, with single faults being injected into the design. On the one hand, the FDC approach managed to detect and correct all injected faults while the CCPP approach could not detect multiple faults created at the output of combinational circuit. On the other hand, the FDC approach leads to higher power consumption and area increase compared to the CCPP approach.
In this paper, an asynchronous design for soft error detection and correction in combinational and sequential circuits is presented. The proposed architecture is called Asynchronous Full Error Detection and Correction (AFEDC). A custom design flow with integrated commercial EDA tools generates the AFEDC using the asynchronous bundled-data design style. The AFEDC relies on an Error Detection Circuit (EDC) for protecting the combinational logic and fault-tolerant latches for protecting the sequential logic. The EDC can be implemented using different detection methods. For this work, two boundary variants are considered, the Full Duplication with Comparison (FDC) and the Partial Duplication with Parity Prediction (PDPP). The AFEDC architecture can handle single events and timing faults of arbitrarily long duration as well as the synchronous FEDC, but additionally can address known metastability issues of the FEDC and other similar synchronous architectures and provide a more practical solution for handling the error recovery process. Two case studies are developed, a carry look-ahead adder and a pipelined non-restoring array divider. Results show that the AFEDC provides equivalent fault coverage when compared to the FEDC while reducing area, ranging from 9.6% to 17.6%, and increasing energy efficiency, which can be up to 6.5%.
This paper proposes an education approach for master and bachelor students to enhance their skills in the area of reliability, safety and security of the electronic components in automated driving. The approach is based on the active synergetic work of research institutes, academia and industry in the frame of joint lab. As an example, the jointly organized summer school with the respective focus is organized and elaborated.