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Use of a standard non-rad-hard digital cell library in the rad-hard design can be a cost-effective solution for space applications. In this paper we demonstrate how a standard non-rad-hard flip-flop, as one of the most vulnerable digital cells, can be converted into a rad-hard flip-flop without modifying its internal structure. We present five variants of a Triple Modular Redundancy (TMR) flip-flop: baseline TMR flip-flop, latch-based TMR flip-flop, True-Single Phase Clock (TSPC) TMR flip-flop, scannable TMR flip-flop and self-correcting TMR flipflop. For all variants, the multi-bit upsets have been addressed by applying special placement constraints, while the Single Event Transient (SET) mitigation was achieved through the usage of customized SET filters and selection of optimal inverter sizes for the clock and reset trees. The proposed flip-flop variants feature differing performance, thus enabling to choose the optimal solution for every sensitive node in the circuit, according to the predefined design constraints. Several flip-flop designs have been validated on IHP's 130nm BiCMOS process, by irradiation of custom-designed shift registers. It has been shown that the proposed TMR flip-flops are robust to soft errors with a threshold Linear Energy Transfer (LET) from (32.4 MeV.cm(2)/mg) to (62.5 MeV.cm(2)/mg), depending on the variant.
The simultaneous switching activity in digital circuits challenges the design of mixed-signal SoCs. Rather than focusing on time-domain noise voltage minimization, this work optimizes switching noise in the frequency domain. A two-tier solution based on the on-chip clock scheduling is proposed. First, to cope with the switching noise at the fundamental clock frequency, which usually dominates in terms of noise power, a two-phase clocking scheme is employed for system timing. Second, on-chip clock latencies are manipulated to target harmonic peaks in specific frequency bands for the spectral noise optimization. An automated design flow, which allows for noise optimization in user-defined application-specific frequency bands, is developed. The effectiveness of our design solution is validated by measurements of substrate noise and conductive EMI (electromagnetic interference) noise on a test chip, which consists of four wireless sensor node baseband processors each addressing a distinct clock-tree-synthesis strategy. Compared to the reference synchronous design, the proposed clock scheduling solution substantially reduces noise in the target GSM-850 band, i.e., by 11.1 dB on the substrate noise and 12.9 dB on the EMI noise, along with dramatic noise peak drops measured at the 50-MHz clock frequency.