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Neißendorfer, Frank
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Si(1-x)Ge(x) laterally graded crystals as monochromators for X-Ray absorption spectroscopy studies
(1999)
Veldkamp, Markus
;
Erko, Alexei
;
Gudat, Wolfgang
;
Abrosimov, Nikolai V.
;
Alex, Volker
;
Khasanov, Salavat
;
Neissendorfer, Frank
;
Pietsch, Ullrich
;
Shekhtman, Veniamin
Energy-dispersive reflectometry and diffractometry at the WLS of BESSY-I
(1999)
Neißendorfer, Frank
;
Pietsch, Ullrich
;
Breszisinski, G.
;
Möhwald, Helmuth
Short-range order in AgAl alloys studied by EXAFS spectroscopy
(1995)
Neißendorfer, Frank
;
Gurman, Stephen J.
;
Zschech, Ehrenfried
;
Pfeiler, Wolfgang
EXAFS-Untersuchungen an langmuir-Blodgett-Multischichten
(1995)
Neißendorfer, Frank
Chemical modification of Topaz surfaces
(1999)
Struth, Bernd
;
Decher, Gero
;
Schmitt, J.
;
Hofmeister, Wolfgang
;
Neißendorfer, Frank
;
Pietsch, Ullrich
;
Brezesinski, Gerald
;
Möhwald, Helmuth
Energy dispersive X-ray reflectometry and X-ray grazing incidence diffraction from organic multilayers
(1997)
Neißendorfer, Frank
;
Bolm, A.
;
Pietsch, Ullrich
The energy dispersive reflectometer at BESSY II : a challenge for thin film analysis
(2001)
Pietsch, Ullrich
;
Grenzer, Jörg
;
Geue, Thomas
;
Neißendorfer, Frank
;
Brezesinski, Gerald
;
Symietz, Christian
;
Möhwald, Helmuth
;
Gudat, Wolfgang
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