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Gössel, Michael (64)
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Design for testability (DFT)
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test response compaction
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A linear code-preserving signature analyzer COPMISR
(1997)
Hlawiczka, A.
;
Gössel, Michael
;
Sogomonyan, Egor S.
A method of construction of combinational self-checking units with detection of all single faults
(1999)
Saposhnikov, V. V.
;
Saposhnikov, Vl. V.
;
Gössel, Michael
;
Morosov, Andrej
A multi-mode scannable memory element for high test application efficiency and delay testing
(1998)
Sogomonyan, Egor S.
;
Singh, Adit D.
;
Gössel, Michael
A multi-mode scannable memory element for high test application efficiency and delay testing
(1999)
Sogomonyan, Egor S.
;
Singh, Adit D.
;
Gössel, Michael
A new design method for self-checking unidirectional combinational circuits
(1998)
Saposhnikov, V. V.
;
Morosov, Andrej
;
Saposhnikov, Vl. V.
;
Gössel, Michael
A new method of redundancy addition for circuit optimization
(1999)
Gössel, Michael
A new parity preserving multi-input signature analyser
(1995)
Sogomonyan, Egor S.
;
Gössel, Michael
A new self-checking sum-bit duplicated carry-select adder
(2003)
Sogomonyan, Egor S.
;
Marienfeld, Daniel
;
Ocheretnij, V.
;
Gössel, Michael
A new self-testing parity checker for ultra-reliable applications
(1996)
Gössel, Michael
;
Sogomonyan, Egor S.
A new totally error propagating compactor for arbitrary cores with digital interfaces
(1999)
Gössel, Michael
;
Sogomonyan, Egor S.
;
Morosov, Andrej
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