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Gössel, Michael (64)
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Design for testability (DFT)
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test response compaction
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Institut für Informatik und Computational Science
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Title
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Author
Detection of permanent faults of a floating point adder by pseudoduplication
(1994)
Gerber, Stefan
;
Gössel, Michael
Self-parity combinational-circuits for self-testing, concurrent fault-detection and parity scan design
(1994)
Gössel, Michael
;
Sogomonyan, Egor S.
Design of cover circuits for monitoring the output of a MISR
(1994)
Bogue, Ted
;
Jürgensen, Helmut
;
Gössel, Michael
Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design
(1994)
Gössel, Michael
;
Sogomonyan, Egor S.
Design of combinational self-testing devices with unidirectionally independent outputs
(1994)
Gössel, Michael
;
Morosov, Andrej
;
Saposhnikov, V. V.
;
Saposhnikov, VL. V.
A new parity preserving multi-input signature analyser
(1995)
Sogomonyan, Egor S.
;
Gössel, Michael
BIST with negligible aliasing through random cover circuits
(1995)
Bogue, Ted
;
Jürgensen, Helmut
;
Gössel, Michael
Design of self-checking unidirectional combinational circuits with low area overhead
(1996)
Saposhnikov, Va. V.
;
Morosov, Andrej
;
Saposhnikov, Vl. V.
;
Gössel, Michael
Synthesis of self-dual multi-output combinational circuits for on-line Teting
(1996)
Moschanin, Wladimir
;
Saposhnikov, Vl. V.
;
Saposhnikov, Va. V.
;
Gössel, Michael
Self-dual parity checking - a new method for on-line testing
(1996)
Saposhnikov, Vl. V.
;
Dimitriev, Alexej
;
Gössel, Michael
;
Saposhnikov, Va. V.
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