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Siebrecht, R. (2)
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1997
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Investigation of partially deuterated multilayers by means of X-ray and polarized neutron reflectometry
(2000)
Karcenko, Anatolij V.
;
Englisch, Uwe
;
Grenzer, Jörg
;
Geue, Thomas
;
Pietsch, Ullrich
;
Siebrecht, R.
The new reflectometer ADAM at the ILL
(1997)
Siebrecht, R.
;
Schreyer, A.
;
Englisch, Uwe
;
Pietsch, Ullrich
;
Zabel, Hartmut
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