Handling manufacturing and aging faults with software-based techniques in tiny embedded systems
- Non-volatile memory area occupies a large portion of the area of a chip in an embedded system. Such memories are prone to manufacturing faults, retention faults, and aging faults. The paper presents a single software based technique that allows for handling all of these fault types in tiny embedded systems without the need for hardware support. This is beneficial for low-cost embedded systems with simple memory architectures. A software infrastructure and a flow are presented that demonstrate how the presented technique is used in general for fault handling right after manufacturing and in-the-field. Moreover, a full implementation is presented for a MSP430 microcontroller, along with a discussion of the performance, overhead, and reliability impacts.
| Author details: | Felix MühlbauerORCiD, Lukas Schröder, Patryk Skoncej, Mario SchölzelORCiDGND |
|---|---|
| DOI: | https://doi.org/10.1109/LATW.2017.7906756 |
| ISBN: | 978-1-5386-0415-1 |
| Title of parent work (English): | 18th IEEE Latin American Test Symposium (LATS 2017) |
| Publisher: | IEEE |
| Place of publishing: | New York |
| Publication type: | Other |
| Language: | English |
| Date of first publication: | 2027/04/24 |
| Publication year: | 2017 |
| Release date: | 2022/11/18 |
| Article number: | 16837119 |
| Number of pages: | 6 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
| DDC classification: | 0 Informatik, Informationswissenschaft, allgemeine Werke / 00 Informatik, Wissen, Systeme |
| Peer review: | Referiert |
