TY  - JOUR
A1  - Kunz, Wolfgang
A1  - Menon, P.
T1  - Multi-level logic optimization by implication analysis
Y1  - 1994
SN  - 0-89791-690-5
SN  - 0-8186-6416-9
SN  - 0-8186-6417-7
ER  - 
TY  - JOUR
A1  - Cobernuss, M.
T1  - Bused interconnection network for parallel memory with linear storage
Y1  - 1994
SN  - 3-05-501602-5
ER  - 
TY  - JOUR
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - Self-parity combinational-circuits for self-testing, concurrent fault-detection and parity scan design
Y1  - 1994
ER  - 
TY  - JOUR
A1  - Gössel, Michael
A1  - Morosov, Andrej
A1  - Saposhnikov, V. V.
A1  - Saposhnikov, VL. V.
T1  - Design of combinational self-testing devices with unidirectionally independent outputs
Y1  - 1994
ER  - 
TY  - JOUR
A1  - Bogue, Ted
A1  - Jürgensen, Helmut
A1  - Gössel, Michael
T1  - Design of cover circuits for monitoring the output of a MISR
Y1  - 1994
SN  - 0-8186-6307-3 , 0-8186-6306-5
ER  - 
TY  - JOUR
A1  - Gössel, Michael
A1  - Sogomonyan, Egor S.
T1  - Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design
Y1  - 1994
ER  - 
TY  - JOUR
A1  - Gerber, Stefan
A1  - Gössel, Michael
T1  - Detection of permanent faults of a floating point adder by pseudoduplication
Y1  - 1994
ER  - 
TY  - JOUR
A1  - Besnard, Philippe
A1  - Schaub, Torsten H.
T1  - A context-based framework for default logics
Y1  - 1993
SN  - 0-262-51071-5
ER  - 
TY  - JOUR
A1  - Krstić, Miloš
A1  - Weidling, Stefan
A1  - Petrovic, Vladimir
A1  - Sogomonyan, Egor S.
T1  - Enhanced architectures for soft error detection and correction in combinational and sequential circuits
JF  - Microelectronics Reliability
N2  - In this paper two new methods for the design of fault-tolerant pipelined sequential and combinational circuits, called Error Detection and Partial Error Correction (EDPEC) and Full Error Detection and Correction (FEDC), are described. The proposed methods are based on an Error Detection Logic (EDC) in the combinational circuit part combined with fault tolerant memory elements implemented using fault tolerant master–slave flip-flops. If a transient error, due to a transient fault in the combinational circuit part is detected by the EDC, the error signal controls the latching stage of the flip-flops such that the previous correct state of the register stage is retained until the transient error disappears. The system can continue to work in its previous correct state and no additional recovery procedure (with typically reduced clock frequency) is necessary. The target applications are dataflow processing blocks, for which software-based recovery methods cannot be easily applied. The presented architectures address both single events as well as timing faults of arbitrarily long duration. An example of this architecture is developed and described, based on the carry look-ahead adder. The timing conditions are carefully investigated and simulated up to the layout level. The enhancement of the baseline architecture is demonstrated with respect to the achieved fault tolerance for the single event and timing faults. It is observed that the number of uncorrected single events is reduced by the EDPEC architecture by 2.36 times compared with previous solution. The FEDC architecture further reduces the number of uncorrected events to zero and outperforms the Triple Modular Redundancy (TMR) with respect to correction of timing faults. The power overhead of both new architectures is about 26–28% lower than the TMR.
Y1  - 2016
SN  - 0026-2714
VL  - 56
SP  - 212
EP  - 220
ER  -