TY  - JOUR
A1  - Miedema, Piter S.
A1  - Thielemann-Kühn, Nele
A1  - Calafell, Irati Alonso
A1  - Schüßler-Langeheine, Christian
A1  - Beye, Martin
T1  - Strain analysis from M-edge resonant inelastic X-ray scattering of nickel oxide films
JF  - Physical chemistry, chemical physics : a journal of European Chemical Societies
N2  - Electronic structure modifications due to strain are an effective method for tailoring nano-scale functional materials. Demonstrated on nickel oxide (NiO) thin films, Resonant Inelastic X-ray Scattering (RIXS) at the transition-metal M-2,M-3-edge is shown to be a powerful tool for measuring the electronic structure modification due to strain in the near-surface region. Analyses from the M-2,M-3-edge RIXS in comparison with dedicated crystal field multiplet calculations show distortions in 40 nm NiO grown on a magnesium oxide (MgO) substrate (NiO/MgO) similar to those caused by surface relaxation of bulk NiO. The films of 20 and 10 nm NiO/MgO show slightly larger differences from bulk NiO. Quantitatively, the NiO/MgO samples all are distorted from perfect octahedral (O-h) symmetry with a tetragonal parameter Ds of about -0.1 eV, very close to the Ds distortion from octahedral (O-h) symmetry parameter of -0.11 eV obtained for the surface-near region from a bulk NiO crystal. Comparing the spectra of a 20 nm film of NiO grown on a 20 nm magnetite (Fe3O4) film on a MgO substrate (NiO/Fe3O4/MgO) with the calculated multiplet analyses, the distortion parameter Ds appears to be closer to zero, showing that the surface-near region of this templated film is less distorted from O-h symmetry than the surface-near region in bulk NiO. Finally, the potential of M-2,M-3-edge RIXS for other investigations of strain on electronic structure is discussed.
Y1  - 2019
U6  - https://doi.org/10.1039/c9cp03593a
SN  - 1463-9076
SN  - 1463-9084
VL  - 21
IS  - 38
SP  - 21596
EP  - 21602
PB  - Royal Society of Chemistry
CY  - Cambridge
ER  - 
TY  - JOUR
A1  - Beye, Martin
A1  - Wernet, Ph.
A1  - Schüßler-Langeheine, Christian
A1  - Föhlisch, Alexander
T1  - Time resolved resonant inelastic X-ray scattering: a supreme tool to understand dynamics in solids and molecules
JF  - Journal of electron spectroscopy and related phenomena : the international journal on theoretical and experimental aspects of electron spectroscopy
N2  - Dynamics in materials typically involve different degrees of freedom, like charge, lattice, orbital and spin in a complex interplay. Time-resolved resonant inelastic X-ray scattering (RIXS) as a highly selective tool can provide unique insight and follow the details of dynamical processes while resolving symmetries, chemical and charge states, momenta, spin configurations, etc. In this paper, we review examples where the intrinsic scattering duration time is used to study femtosecond phenomena. Free-electron lasers access timescales starting in the sub-ps range through pump-probe methods and synchrotrons study the time scales longer than tens of ps. In these examples, time-resolved resonant inelastic X-ray scattering is applied to solids as well as molecular systems.
KW  - Resonant inelastic X-ray scattering
KW  - Ultrafast spectroscopy
KW  - Phase transitions
KW  - Molecular dynamics
Y1  - 2013
U6  - https://doi.org/10.1016/j.elspec.2013.04.013
SN  - 0368-2048
VL  - 188
IS  - 3
SP  - 172
EP  - 182
PB  - Elsevier
CY  - Amsterdam
ER  -