TY  - JOUR
A1  - Di Pietro, Riccardo
A1  - Venkateshvaran, Deepak
A1  - Klug, Andreas
A1  - List-Kratochvil, Emil J. W.
A1  - Facchetti, Antonio
A1  - Sirringhaus, Henning
A1  - Neher, Dieter
T1  - Simultaneous extraction of charge density dependent mobility and variable contact resistance from thin film transistors
JF  - Applied physics letters
N2  - A model for the extraction of the charge density dependent mobility and variable contact resistance in thin film transistors is proposed by performing a full derivation of the current-voltage characteristics both in the linear and saturation regime of operation. The calculated values are validated against the ones obtained from direct experimental methods. This approach allows unambiguous determination of gate voltage dependent contact and channel resistance from the analysis of a single device. It solves the inconsistencies in the commonly accepted mobility extraction methods and provides additional possibilities for the analysis of the injection and transport processes in semiconducting materials. (C) 2014 AIP Publishing LLC.
Y1  - 2014
U6  - https://doi.org/10.1063/1.4876057
SN  - 0003-6951
SN  - 1077-3118
VL  - 104
IS  - 19
PB  - American Institute of Physics
CY  - Melville
ER  - 
TY  - JOUR
A1  - Raoufi, Meysam
A1  - Hörmann, Ulrich
A1  - Ligorio, Giovanni
A1  - Hildebrandt, Jana
A1  - Pätzel, Michael
A1  - Schultz, Thorsten
A1  - Perdigon-Toro, Lorena
A1  - Koch, Norbert
A1  - List-Kratochvil, Emil
A1  - Hecht, Stefan
A1  - Neher, Dieter
T1  - Simultaneous effect of ultraviolet radiation and surface modification on the work function and hole injection properties of ZnO thin films
JF  - Physica Status Solidi.  A , Applications and materials science
N2  - The combined effect of ultraviolet (UV) light soaking and self-assembled monolayer deposition on the work function (WF) of thin ZnO layers and on the efficiency of hole injection into the prototypical conjugated polymer poly(3-hexylthiophen-2,5-diyl) (P3HT) is systematically investigated. It is shown that the WF and injection efficiency depend strongly on the history of UV light exposure. Proper treatment of the ZnO layer enables ohmic hole injection into P3HT, demonstrating ZnO as a potential anode material for organic optoelectronic devices. The results also suggest that valid conclusions on the energy-level alignment at the ZnO/organic interfaces may only be drawn if the illumination history is precisely known and controlled. This is inherently problematic when comparing electronic data from ultraviolet photoelectron spectroscopy (UPS) measurements carried out under different or ill-defined illumination conditions.
KW  - charge injection across hybrid interfaces
KW  - energy-level alignments
KW  - hybrid metal oxides
KW  - organic interfaces
Y1  - 2020
U6  - https://doi.org/10.1002/pssa.201900876
SN  - 1862-6300
SN  - 1862-6319
VL  - 217
IS  - 5
SP  - 1
EP  - 6
PB  - Wiley-VCH
CY  - Weinheim
ER  -