TY  - JOUR
A1  - Könnecke, Rene
A1  - Follath, R.
A1  - Pontius, N.
A1  - Schlappa, J.
A1  - Eggenstein, F.
A1  - Zeschke, T.
A1  - Bischoff, P.
A1  - Schmidt, J. -S.
A1  - Noll, T.
A1  - Trabant, C.
A1  - Schreck, S.
A1  - Wernet, Ph.
A1  - Eisebitt, S.
A1  - Senf, F.
A1  - Schuessler-Langeheine, Christian
A1  - Erko, A.
A1  - Föhlisch, Alexander
T1  - The confocal plane grating spectrometer at BESSY II
JF  - Journal of electron spectroscopy and related phenomena : the international journal on theoretical and experimental aspects of electron spectroscopy
N2  - At BESSY II a confocal plane grating spectrometer for resonant inelastic X-ray scattering (RIXS) is currently under commissioning. The new endstation operates with a source size of 4 x 1 mu m(2) provided by its dedicated beamline. The RIXS-spectrometer covers an energy range from 50 eV to 1000 eV, providing a resolving power E/Delta E of 5000-15,000. The beamline allows full polarization control and gives a photon flux of up to 7 x 10(14) photons/s/0.1 A/0.1%bandwidth by offering a resolving power E/Delta E of 4000-12,000.
KW  - Resonant inelastic X-ray scattering
KW  - Soft X-ray monochromator
KW  - High transmission micro focus beamline
KW  - Plane grating emission spectrometer
Y1  - 2013
U6  - https://doi.org/10.1016/j.elspec.2012.11.003
SN  - 0368-2048
VL  - 188
SP  - 133
EP  - 139
PB  - Elsevier
CY  - Amsterdam
ER  -