TY - JOUR A1 - Tran Thanh Tuan, A1 - Pham Chi Vinh, A1 - Ohrnberger, Matthias A1 - Malischewsky, Peter A1 - Aoudia, Abdelkrim T1 - An Improved Formula of Fundamental Resonance Frequency of a Layered Half-Space Model Used in H/V Ratio Technique JF - Pure and applied geophysics N2 - The resonance frequency of the transmission response in layered half-space model is important in the study of site effect because it is the frequency where the shake-ability of the ground is enhanced significantly. In practice, it is often determined by the H/V ratio technique in which the peak frequency of recorded H/V spectral ratio is interpreted as the resonance frequency. Despite of its importance, there has not been any formula of the resonance frequency of the layered half-space structure. In this paper, a simple approximate formula of the fundamental resonance frequency is presented after an exact formula in explicit form of the response function of vertically SH incident wave is obtained. The formula is in similar form with the one used in H/V ratio technique but it reflects several major effects of the model to the resonance frequency such as the arrangement of layers, the impedance contrast between layers and the half-space. Therefore, it could be considered as an improved formula used in H/V ratio technique. The formula also reflects the consistency between two approaches of the H/V ratio technique based on SH body waves or Rayleigh surface waves on the peak frequency under high impedance contrast condition. This formula is in explicit form and, therefore, may be used in the direct and inverse problem efficiently. A numerical illustration of the improved formula for an actual layered half-space model already investigated by H/V ratio technique is presented to demonstrate its new features and its improvement to the currently used formula. KW - Response function KW - H/V ratio technique KW - Orthotropy KW - SH waves KW - Quarter-wavelength principle Y1 - 2016 U6 - https://doi.org/10.1007/s00024-016-1313-0 SN - 0033-4553 SN - 1420-9136 VL - 173 SP - 2803 EP - 2812 PB - Springer CY - Basel ER -