TY  - JOUR
A1  - Kupsch, Andreas
A1  - Mueller, Bernd R.
A1  - Lange, Axel
A1  - Bruno, Giovanni
T1  - Microstructure characterisation of ceramics via 2D and 3D X-ray refraction techniques
JF  - Journal of the European Ceramic Society
N2  - 3D imaging techniques are very fashionable nowadays, and allow enormous progress in understanding ceramic microstructure, its evolution, and its link to mechanical, thermal, and transport properties. In this feature article, we report the use of a powerful, yet not so wide-spread, set of X-ray techniques based on refraction effects. X-ray refraction allows determining internal specific surface (surface per unit volume) in a non-destructive fashion, position and orientation sensitive, and with a nanometric detectability. While the techniques are limited by the X-ray absorption of the material under investigation, we demonstrate showcases of ceramics and composite materials, where understanding of process parameter influence or simply of microstructural parameters could be achieved in a way unrivalled even by high-resolution techniques such as electron microscopy or computed tomography. (C) 2016 Elsevier Ltd. All rights reserved.
KW  - X-ray refraction
KW  - Porosity
KW  - Specific surface
KW  - Crack detection
KW  - Composites
Y1  - 2017
U6  - https://doi.org/10.1016/j.jeurceramsoc.2016.12.031
SN  - 0955-2219
SN  - 1873-619X
VL  - 37
SP  - 1879
EP  - 1889
PB  - Elsevier
CY  - Oxford
ER  -