TY  - JOUR
A1  - Qiu, Xunlin
A1  - Benjamin, Aravindan Joseph
A1  - Raman Venkatesan, Thulasinath
A1  - Schmidt, Georg C.
A1  - Soler, Ricardo Alonso Quintana
A1  - Panicker, Pramul Muraleedhara
A1  - Gerhard, Reimund
A1  - Hübler, Arved Carl
T1  - Dielectric and electroacoustic assessment of screen-printed piezoelectric polymer layers as flexible transducers
BT  - influence of the electrode material
JF  - IEEE transactions on dielectrics and electrical insulation
N2  - Here, piezoelectric transducers consisting of a P(VDF-TrFE) layer with either silver or PEDOT:PSS screen-printed electrodes are studied. The influence of electrodes on the dielectric and electroacoustic properties are studied in dielectric-spectroscopy and ferroelectric-hysteresis measurements. Only when both the bottom and the top electrodes are made of silver, the typical dielectric relaxation of the P(VDF-TrFE) layer is clearly observed. When one or two of the electrodes are of PEDOT:PSS, a Debye-like relaxation is present. Compared with silver electrodes, PEDOT:PSS electrodes allow for moderate self-healing. Consequently, samples with bottom and top PEDOT:PSS electrodes can be poled to saturation, while samples with silver electrodes can hardly be poled to saturation due to destructive electric breakdown. Acoustic transducer measurements show that silver electrodes facilitate higher and broader frequency operation, while PEDOT:PSS electrodes bring slightly lower total harmonic distortion. Overall, the acoustic performance shows no significant deviations between differently electroded samples so that silver electrodes do not offer any advantages for the transducers studied here due to their much higher tendency for destructive electric breakdown.
KW  - poly(vinylidenefluoride-trifluoroethylene) P(VDF-TrFE)
KW  - dielectric
KW  - spectroscopy
KW  - ferroelectricity and piezoelectricity in polymers
KW  - screen
KW  - printing
KW  - printed electroacoustic thin-film transducers
Y1  - 2020
U6  - https://doi.org/10.1109/TDEI.2020.008864
SN  - 1070-9878
SN  - 1558-4135
SN  - 0018-9367
VL  - 27
IS  - 5
SP  - 1683
EP  - 1690
PB  - Institute of Electrical and Electronics Engineers
CY  - New York, NY
ER  -