TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Lübbert, Daniel
A1  - Baumbach, Tilo
T1  - Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Paschke, K.
A1  - Geue, Thomas
A1  - Barberka, Thomas Andreas
A1  - Bolm, A.
A1  - Pietsch, Ullrich
A1  - Rösch, M.
A1  - Batke, Edwin
A1  - Faller, F.
A1  - Kerkel, K.
A1  - Oshiniwo, J.
A1  - Forchel, Alfred
T1  - Characterization of lateral semiconductor nano structures by means of x-ray grazing-incidence diffraction
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Darowski, Nora
A1  - Paschke, K.
A1  - Pietsch, Ullrich
A1  - Wang, K. H.
A1  - Forchel, Alfred
A1  - Baumbach, Tilo
A1  - Zeimer, Ute
T1  - Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
Y1  - 1997
ER  -