@article{KuentzerJuracyMoreiraetal.2020,
  author    = {Kuentzer, Felipe A. and Juracy, Leonardo R. and Moreira, Matheus T. and Amory, Alexandre M.},
  title     = {Testing the blade resilient asynchronous template},
  series = {Analog integrated circuits and signal processing : an international journal},
  volume    = {106},
  journal   = {Analog integrated circuits and signal processing : an international journal},
  number    = {1},
  publisher = {Springer},
  address   = {Dordrecht},
  issn      = {0925-1030},
  doi       = {10.1007/s10470-020-01651-8},
  pages     = {219 -- 234},
  year      = {2020},
  abstract  = {As VLSI design moves into ultra-deep-submicron technologies, timing margins added to the clock period are mandatory, to ensure correct circuit behavior under worst-case conditions. Timing resilient architectures emerged as a promising solution to alleviate these worst-case timing margins. These architectures allow improving system performance and reducing energy consumption. Asynchronous systems, on the other hand, have the potential to improve energy efficiency and performance. Blade is an asynchronous timing resilient template that leverages the advantages of both asynchronous and timing resilient techniques. However, Blade still presents challenges regarding its testability, which hinders its commercial or large-scale application. This paper demonstrates that scan chains can be prohibitive for Blade due to their high silicon costs., which can reach more than 100\%. Then, it proposes an alternative test approach that allows concurrent testing, stuck-at, and delay testing. The test approach is based on the reuse the Blade features to provide testability, with silicon area overheads between 4 and 7\%.},
  language  = {en}
}
@article{KuentzerKrstić2020,
  author    = {Kuentzer, Felipe A. and Krstić, Miloš},
  title     = {Soft error detection and correction architecture for asynchronous bundled data designs},
  series = {IEEE transactions on circuits and systems},
  volume    = {67},
  journal   = {IEEE transactions on circuits and systems},
  number    = {12},
  publisher = {Institute of Electrical and Electronics Engineers},
  address   = {New York},
  issn      = {1549-8328},
  doi       = {10.1109/TCSI.2020.2998911},
  pages     = {4883 -- 4894},
  year      = {2020},
  abstract  = {In this paper, an asynchronous design for soft error detection and correction in combinational and sequential circuits is presented. The proposed architecture is called Asynchronous Full Error Detection and Correction (AFEDC). A custom design flow with integrated commercial EDA tools generates the AFEDC using the asynchronous bundled-data design style. The AFEDC relies on an Error Detection Circuit (EDC) for protecting the combinational logic and fault-tolerant latches for protecting the sequential logic. The EDC can be implemented using different detection methods. For this work, two boundary variants are considered, the Full Duplication with Comparison (FDC) and the Partial Duplication with Parity Prediction (PDPP). The AFEDC architecture can handle single events and timing faults of arbitrarily long duration as well as the synchronous FEDC, but additionally can address known metastability issues of the FEDC and other similar synchronous architectures and provide a more practical solution for handling the error recovery process. Two case studies are developed, a carry look-ahead adder and a pipelined non-restoring array divider. Results show that the AFEDC provides equivalent fault coverage when compared to the FEDC while reducing area, ranging from 9.6\% to 17.6\%, and increasing energy efficiency, which can be up to 6.5\%.},
  language  = {en}
}