@article{KoenneckeFollathPontiusetal.2013,
  author    = {K{\"o}nnecke, Rene and Follath, R. and Pontius, N. and Schlappa, J. and Eggenstein, F. and Zeschke, T. and Bischoff, P. and Schmidt, J. -S. and Noll, T. and Trabant, C. and Schreck, S. and Wernet, Ph. and Eisebitt, S. and Senf, F. and Schuessler-Langeheine, Christian and Erko, A. and F{\"o}hlisch, Alexander},
  title     = {The confocal plane grating spectrometer at BESSY II},
  series = {Journal of electron spectroscopy and related phenomena : the international journal on theoretical and experimental aspects of electron spectroscopy},
  volume    = {188},
  journal   = {Journal of electron spectroscopy and related phenomena : the international journal on theoretical and experimental aspects of electron spectroscopy},
  publisher = {Elsevier},
  address   = {Amsterdam},
  issn      = {0368-2048},
  doi       = {10.1016/j.elspec.2012.11.003},
  pages     = {133 -- 139},
  year      = {2013},
  abstract  = {At BESSY II a confocal plane grating spectrometer for resonant inelastic X-ray scattering (RIXS) is currently under commissioning. The new endstation operates with a source size of 4 x 1 mu m(2) provided by its dedicated beamline. The RIXS-spectrometer covers an energy range from 50 eV to 1000 eV, providing a resolving power E/Delta E of 5000-15,000. The beamline allows full polarization control and gives a photon flux of up to 7 x 10(14) photons/s/0.1 A/0.1\%bandwidth by offering a resolving power E/Delta E of 4000-12,000.},
  language  = {en}
}