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Masking of X-Values by use of a hierarchically configurable register

  • In this paper we consider masking of unknowns (X-values) for VLSI circuits. We present a new hierarchical method of X-masking which is a major improvement of the method proposed in [4], called WIDE1. By the method proposed, the number of observable scan cells is optimized and data volume for X-masking can be significantly reduced in comparison to WIDEL This is demonstrated for three industrial designs. In cases where all X-values have to be masked the novel approach is especially efficient.

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Metadaten
Author:Thomas Rabenalt, Michael Goessel, Andreas Leininger
DOI:https://doi.org/10.1007/s10836-010-5179-2
ISSN:0923-8174 (print)
Parent Title (English):Journal of electronic testing : theory and applications
Publisher:Springer
Place of publication:Dordrecht
Document Type:Article
Language:English
Year of first Publication:2011
Year of Completion:2011
Release Date:2017/03/26
Tag:Hierarchically configurable mask register; Masking of X-values
Volume:27
Issue:1
Pagenumber:11
First Page:31
Last Page:41
Funder:German Federal Ministry for Education and Research (BMBF) [01M3063A]
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science
Peer Review:Referiert
Institution name at the time of publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik