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A signature analysis technique for the identification of failing vectors with application to Scan-BIST

  • We present a new technique for uniquely identifying a single failing vector in an interval of test vectors. This technique is applicable to combinational circuits and for scan-BIST in sequential circuits with multiple scan chains. The proposed method relies on the linearity properties of the MISR and on the use of two test sequences, which are both applied to the circuit under test. The second test sequence is derived from the first in a straightforward manner and the same test pattern source is used for both test sequences. If an interval contains only a single failing vector, the algebraic analysis is guaranteed to identify it. We also show analytically that if an interval contains two failing vectors, the probability that this case is interpreted as one failing vector is very low. We present experimental results for the ISCAS benchmark circuits to demonstrate the use of the proposed method for identifying failing test vectors

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Metadaten
Author:Michael Goessel, K. Chakrabarty, V. Ocheretnij, Andreas Leininger
ISSN:0923-8174
Document Type:Article
Language:English
Year of first Publication:2004
Year of Completion:2004
Release Date:2017/03/24
Source:Journal of Electronic Testing-Theory and Applications. - ISSN 0923-8174. - 20 (2004), 6, S. 611 - 622
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science
Peer Review:Referiert
Institution name at the time of publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik