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A multi-mode scannable memory element for high test application efficiency and delay testing

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Author details:Egor S. Sogomonyan, Adit D. Singh, Michael GösselGND
Publication type:Article
Language:English
Year of first publication:1999
Publication year:1999
Release date:2017/03/24
Source:Journal of electronic testing : theory and applications. - 15 (1999), S. 87 - 96
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science
Publishing method:Open Access
Institution name at the time of the publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik
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