Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
| Author details: | Adit D. Singh, Egor S. Sogomonyan, Michael GösselGND, Markus Seuring |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 1999 |
| Publication year: | 1999 |
| Release date: | 2017/03/24 |
| Source: | Proceedings / International test conference 1999. - Piscataway : IEEE Service Center, 1999. - S. 227 - 235 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
| Publishing method: | Open Access |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik |
