Built-in test for circuits with scan based on reseeding of multiole polynomial linear feedback shift registers
Author details: | Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkatraman, Bernard Courtois |
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Publication type: | Article |
Language: | English |
Year of first publication: | 1995 |
Publication year: | 1995 |
Release date: | 2017/03/25 |
Source: | IEEE transactions on computers. - 44 (1995), 2, S. 223 - 233 |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik |