A multi-mode scannable memory element for high test application efficiency and delay testing
| Author details: | Egor S. Sogomonyan, Adit D. Singh, Michael GösselGND |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 1998 |
| Publication year: | 1998 |
| Release date: | 2017/03/24 |
| Source: | Proceedings / 16th IEEE VLSI Test Symposium. - Los Alamitos : IEEE Computer Society Press, 1998. - S. 324 - 331 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
| Publishing method: | Open Access |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik |
