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Design of cover circuits for monitoring the output of a MISR

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Author details:Ted Bogue, Helmut Jürgensen, Michael GösselGND
ISBN:0-8186-6307-3 , 0-8186-6306-5
Publication type:Article
Language:English
Year of first publication:1994
Publication year:1994
Release date:2017/03/25
Source:International Symposium on Defect and Fault Tolerance in VLSI Systems <1994, Montréal>: 1994 proceedings / the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17 - 19, 1994, Montréal, Québec, Canada / sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing. - Los Alamitos, Calif. [u.a.] : IEEE Computer Society Press, 1994. - ISBN 0-8186-6307-3 , 0-8186-6306-5. - S. 124 - 132
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science
Institution name at the time of the publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik
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