Self-parity combinational-circuits for self-testing, concurrent fault-detection and parity scan design
Author details: | Michael GösselGND, Egor S. Sogomonyan |
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Publication type: | Article |
Language: | English |
Year of first publication: | 1994 |
Publication year: | 1994 |
Release date: | 2017/03/25 |
Source: | VLSI 93. - 42 (1994), S. 103 - 111 |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik |