Self-parity combinational-circuits for self-testing, concurrent fault-detection and parity scan design
| Author details: | Michael GösselGND, Egor S. Sogomonyan |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 1994 |
| Publication year: | 1994 |
| Release date: | 2017/03/25 |
| Source: | VLSI 93. - 42 (1994), S. 103 - 111 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik |
