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Fault-tolerant self-dual circuits with error detection by parity- and group parity prediction

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Author details:Vitalij Otscheretnij, Michael GösselGND, Vl. V. Saposhnikov, V. V. Saposhnikov
Publication type:Article
Language:English
Year of first publication:1998
Publication year:1998
Release date:2017/03/24
Source:4th IEEE international on-line testing workshop : proceedings. - IEEE Press, 1998. - S. 124 - 130
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science
Institution name at the time of the publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik
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