Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems
| Author details: | Egor S. Sogomonyan, Michael GösselGND |
|---|---|
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 1996 |
| Publication year: | 1996 |
| Release date: | 2017/03/25 |
| Source: | Proceedings / 14th IEEE VLSI Test Symposium. - Los Alamitos : IEEE Computer Society Press, 1996. - S. 138 - 144 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
| Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik |
