A scan based concrrent BIST approach for low cost on-line testing
Author details: | Egor S. Sogomonyan, Adit D. Singh, Michael GösselGND |
---|---|
Publication type: | Article |
Language: | English |
Year of first publication: | 1998 |
Publication year: | 1998 |
Release date: | 2017/03/24 |
Source: | 4th IEEE international on-line testing workshop : proceedings. - IEEE Press, 1998. - S. 52 - 55 |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik und Computational Science |
Institution name at the time of the publication: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Informatik |